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Fast Facts

Extended Defects in Semiconductors (EDS 2008)

Sep 14, 2008 - Sep 19, 2008
Futuroscope Technopole Poitiers France
 

Highlights

The aim of the conference is to provide a forum on the current state of art on investigation and modelling of extended defects in semiconductors. Scientists from universities, research institutes, and industry are welcome to contribute to a deeper understanding of extended defects, their interaction with point defects, and their role in the development of semiconductor technology.











See review

Event Profiles

Sponsors: Phys Tech, csm Instruments, JEOL, PHYMAT, DGA

Contact Details

Email address:
Event website: http://eds2008.sp2mi.univ-poitiers.fr/
Fax: +33 (0) 5 49 49 66 9

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